The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 1991
Filed:
Mar. 21, 1990
Donald E Vandenberg, Brockport, NY (US);
William D Humbel, Rochester, NY (US);
Thomas W Dey, Rochester, NY (US);
John G Pitek, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
The historical Foucault knife-edge test enables one to passively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The historical Foucault knife-edge test corresponds to an open loop control system, since a control action, which is that quantity responsible for producing the imaging device characteristic, or open loop output, is independent of that output. The present invention, in sharp contrast to the historical Foucault knife-edge test, discloses a method for closing the Foucault open loop, so that the control action is somehow dependent on the output. In this way, accordingly, dynamic steps can be taken to compensate for, or remove the optical aberrations.