The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 1991

Filed:

Apr. 25, 1989
Applicant:
Inventor:

Jonathan Ophir, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
12866006 ; 73599 ; 12866009 ;
Abstract

The present invention provides a novel method and apparatus which allows concomitant imaging and rapid axial beam translation measurements used to calculate the attenuation characteristics of a target body. The present invention employs an ultrasonic scanner which contains a plurality of matched transducer elements. These elements are staggered on a mechanism which sequentially places each transducer opposite an acoustic window at axially spaced positions along a common axis. The present invention also enables axial beam translation techniques to be adapted to current ultrasonic imaging systems.


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Ophir, Jonathan. (1991). System for ultrasonic pan focal imaging and axial beam translation (U.S. Patent No. 4993416). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4993416

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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