The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 1991
Filed:
Mar. 26, 1990
David L Burk, Pittsburgh, PA (US);
Allegheny Ludlum Corporation, Pittsburgh, PA (US);
Abstract
A novel micrometer apparatus is provided which is capable of providing strip workpiece thickness measurements with high precision and without operator dependence, the apparatus including a fixed anvil mounted to a 'C' frame, a movable shaft mounted opposite the fixed anvil at a separation distance from the fixed anvil which represents the thickness of material therebetween, the fixed anvil being held in position by the full weight of the apparatus and the center of gravity of the apparatus passes through the fixed anvil and solidly against the top surface of the essentially horizontal strip being measured, an indicator having a measuring head for carrying the movable shaft which contacts the bottom side of the strip opposite the fixed anvil, and a display head positioned atop the micrometer apparatus above the strip such that the thickness measurement is performed and displayed automatically while the apparatus sits unattended on the workpiece.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile