The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 1991
Filed:
Jan. 31, 1990
Shein S Wang, Ponca City, OK (US);
Doublas W Hanson, Ponca City, OK (US);
Thomas D Cavanaugh, Ponca City, OK (US);
Conoco Inc., Ponca City, OK (US);
Abstract
A method for performing velocity analysis while eliminating the effects on weak signals caused by strong signals includes migrating each event of the pre-stack trace to a single location instead of all possible locations. This correct location is determined by ray-tracing through a velocity model. The input trace is divided into many windows, and each window is migrated to a place determined by ray-tracing the center of the window through the model. If the velocity model is accurate, each event will be migrated to the proper location yielding an accurate depth section with no migration artifacts. As a by-product, if the model is not accurate, the post-migrated parts (PMP's) provide a clean velocity analysis.