The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 1991
Filed:
Mar. 03, 1989
Shigeru Takayama, Yokkaichi, JP;
Yukitaka Goto, Yokkaichi, JP;
Mitsubishi Petrochemical Company Limited, Tokyo, JP;
Abstract
An apparatus for fractionally measuring a polymer comprising: a flow path change valve unit A having an inlet for pouring a sample polymer solution, a loop for metering the sample polymer solution, an internal standard solution pouring mechanism including a loop for metering the liquid and a valve for pouring the liquid, and a valve for changing the system flow path; a composition fractionation unit B which is provided with a column filled with a filler, and which permits the polymer dissolved in the sample polymer solution transferred from the loop for metering the sample polymer solution to precipitate on the filler, and then fractionally dissolves the polymer by stepwisely raising the temperature in the column; a molecular size fractionation unit C which is provided with a column filled with a filler, and which fractionates, depending upon the molecular size, the sample polymer fraction solution which has undergone composition fractionation in the unit B and which is batchwisely transferred therefrom; a solvent feeding unit D which feeds at a predetermined flow rate a solvent for use in the fractional dissolution of the sample polymer in the unit B and for transferring the obtained sample polymer fraction solutions; a detection unit E which deflects the results of fractionation obtained in the unit C and measures the molecular weight distribution; a system controller; and automatic temperature controllers.