The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 1991

Filed:

Oct. 02, 1989
Applicant:
Inventors:

Ulrich Sander, Oberkochen, DE;

Ulrich Lemke, Oggenhausen, DE;

Albrecht Vogel, Oberkochen, DE;

Assignee:

Carl-Zeiss-Stiftung, Heidenheim/Brenz, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350507 ; 350511 ; 350527 ; 350286 ;
Abstract

A microscope having two optomechanically coupled observation barrels to permit simultaneous use by two individuals. While each barrel is provided with its own eyepieces and its own magnification system, they share a common optical axis including a single objective lens and a specially designed composite prism which allows part of the observation beam (the light reflected by the object) to pass through it, undiminished, to one of the observation barrels, while the other part of this light is deflected to the other observation barrel by a mirror layer within the prism. The microscope's illumination beam is directed onto the object field along the same common optical axis followed by the returning observation beam, and this illumination is deflected into this optical axis at a point between the object field and the objective lens.


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