The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 1991
Filed:
Aug. 08, 1989
Wayne Roberge, Hopewell, NJ (US);
Brian Flannery, Clinton, NJ (US);
Exxon Research and Engineering Company, Florham Park, NJ (US);
Abstract
The present invention is a method for examining at least a portion of an object using penetration radiation. The method includes the steps of transmitting radiation from an external source through the object in a plurality of coplanar rays, detecting the attenuated transmitted radiation after it has passed through the object, determining the projection data for said rays, and inverting said projection data to generate the distribution of the attenuation coefficient, wherein said inverting step includes the Direct Fourier Inversion Method such that the projection data is padded and the Fourier coefficients are filtered.