The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 1991
Filed:
Jan. 04, 1990
Brian R Spies, McKinney, TX (US);
Atlantic Richfield Company, Los Angeles, CA (US);
Abstract
A transient electromagnetic method for detecting irregularities on container walls by measuring wall thickness. The method utilizes a transmitting antenna and a separate receiving antenna arranged in a loop-loop configuration. The transmitting antenna induces current into the container wall and the receiving antenna and the receiver detect the decay of the induced current, which is then analyzed to detect wall thickness. A receiving antenna array of many receiving antennas is used to increase the spatial resolution. Simultaneous measurement of the induced current by the receiving antennas reduces noise that is coherent across the array. Use of a noise antenna located so as to be unaffected by the transmitting antenna further reduces noise. The received signal from the receiving antenna array is displayed on a two-dimensional display in a spatial arrangement that corresponds to the spatial arrangement of the receiving antennas. The display can be scrolled over the time range of the received signals to produce a moving image, so that irregular areas can be more easily detected than with a static display.