The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 1991
Filed:
Jun. 06, 1989
Applicant:
Inventors:
Assignee:
Nippon Steel Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250310 ; 250306 ; 250307 ;
Abstract
The strains in crystals are evaluated by quantifying the sharpness of an electron channeling pattern and determining changes in the quantified sharpness of the electron channeling pattern. There is such a close correlation between the sharpness of the electron channeling pattern and the strains in crystals that the latter can be evaluated in terms of changes in the former. An apparatus for evaluating strains in crystals comprises a scanning electron microscope having a function to form an electron channeling pattern and an image analyzer having a function to quantify the sharpness of an electron channeling pattern.