The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 1991
Filed:
Jul. 22, 1988
Applicant:
Inventors:
Assignee:
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01D / ; G01P / ;
U.S. Cl.
CPC ...
25023116 ; 25023114 ; 341 11 ; 341 13 ;
Abstract
A measuring device is provided in which a graduated plate is scanned in at least two scanning locations. The scanning signals from the different scanning locations are transmitted to a testing circuit which determines whether the phase displacement between the scanning signals exceeds a limit value. If the limit value is exceeded, one of the scanning locations is weighted higher than the other. The weighting is implemented by increasing the components of the signals from one scanning location while decreasing the components from the signals from the other scanning location.