The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 1991

Filed:

Jul. 06, 1988
Applicant:
Inventors:

Takaaki Kawamura, Yokohama, JP;

Tomoyasu Yamazaki, Tokyo, JP;

Assignee:

Nissan Motor Co., Ltd., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356394 ; 356376 ; 356377 ;
Abstract

In order to accurately scan an object for the purposes of determining the dimensions, surface finish or the like, the position of the object according to the measuring system coordinate grid is determined. Using this orientation, the degree of misalignment with respect to a standard position on the grid is determined and the scanning devices which perform the actual measurement, are moved to positions which take the amount of misalignment into consideration and wherein accurate examination is assured.


Find Patent Forward Citations

Quick Actions:

Kawamura, Takaaki. (1991). Automatic quality control measuring system for automotive assembly line (U.S. Patent No. 4989981). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4989981

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…