The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 1991
Filed:
Apr. 26, 1989
Gregory A Campbell, Canton, NY (US);
Bangshu Cao, Potsdam, NY (US);
Paul A Sweeney, Potsdam, NY (US);
Other;
Abstract
A device and method are provided for determining the bulk (average) temperature, surface temperature, temperature profile, and thickness of radiation translucent materials. These material functions are determined by evaluation of the intensity of the radiation emitted from the material using two detectors with a radiation source placed in the optical path of one of the detectors. The data is taken at several intensities of source radiation and reduced to obtain the bulk temperature and material thickness. The second detector is used to measure the surface temperature. These data are then used to determine the temperature profile in the material.