The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Mar. 24, 1989
Hugh W Littlebury, Chandler, AZ (US);
Mavin C Swapp, Mesa, AZ (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
An interface apparatus for coupling a multi-channel tester to a high pin count logic circuit for use in testing the logic circuit is provided wherein a plurality of terminal electronics units are coupled to each test channel of the multi-channel tester. Some of the terminal electronics units are coupled to each other in parallel by at least one stimulus shift register, which serves to divide a serial stimulus vector among the terminal electronics units, and one response shift register, which serve to assembly the response data from several terminal electronics units into a serial response vector. The serial stimulus vector is generated, and the serial response vector is analyzed by the multi-channel tester. The apparatus is capable of operating in one of a plurality of modes used for functional testing, parametric testing, and high speed scan path testing of the logic circuit.