The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Jun. 22, 1988
Masato Yamashita, Hitachi, JP;
Hideo Enjyouji, Tokyo, JP;
Hiroshi Kurihara, Yokkaichi, JP;
Shoji Yamaguchi, Yokkaichi, JP;
Hideto Shimizu, Yokkaichi, JP;
Nichio Hashizume, Hiratsuka, JP;
Yasusuke Mori, Hiratsuka, JP;
Mitsubishi Petrochemical Company Ltd., Tokyo, JP;
Abstract
A method and apparatus for measuring resistivity employ the four-point probe method to measure the surface resistivity or volume resistivity of a sample. The method includes inputting sample shape information and calculating a resistance correction coefficient for the sample based on the shape information and information relating to a measurement position on the sample. The sample surface resistivity or volume resistivity is calculated by multiplying a resistance value, which is measured in accordance with the four-point probe method, by the correction coefficient.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile