The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Jan. 23, 1990
Teruo Eino, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
An inspection method utilizing computer graphics in inspecting a certain part of an object which is being imaged by an image pickup apparatus such as an electronic scope. A computer-graphics picture simulating th eobject picture obtained by the image pickup apparatus is drawn by means of a computer-graphics apparatus. The parameters used for the drawing are varied so as to approximate or equalize the computer-graphics picture to or with the object picture, thereby making it possible for any flaw or the like on the object to be detected with ease by comparing the two picture with each other even if the object has a complicated configuration. Furthermore, that portion of the computer-graphics picture which corresponds to the inspected part of the object picture is specified, and, by using information on the portion thus specified, inspections on the inspected part, such as measurement of length and examination for discoloration, can be performed.