The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Apr. 06, 1989
Applicant:
Inventors:
Russell J Palum, Pittsford, NY (US);
John E Greivenkamp, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250561 ; 356-4 ;
Abstract
A Moire distance measurement technique for measuring the distance that a diffusely reflecting surface moves involves projecting a first grating onto the surface, imaging the projected grating onto a second grating to form a Moire pattern, and measuring a change in the Moire pattern as the surfaces move to determine the distance that the surface has moved.