The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1991
Filed:
Dec. 13, 1988
Marcos G Ortiz, Freehold, NJ (US);
Marsha S Stix, Tinton Falls, NJ (US);
AT&T Bell Laboratories, Murray Hill, NJ (US);
Abstract
A sample inspection arrangement incorporates a sample of polyethylene with an included defect, or flaw, a light source containing near infrared wavelengths, and a video camera. Polyethylene has relatively high spectral transmissivity for wavelengths in the band of near infrared wavelengths. The video camera collects data from a beam of the near infrared light which either reflects from or is transmitted directly through a portion of the polyethylene sample. Data is collected from both defect free portions of the polyethylene sample and portions of polyethylene sample including at least one defect. A visual image of the polyethylene sample and included defect is produced on either a video monitor, a paper print out, or a photograph. The method for inspecting a sample of cable or a continuously moving section of cable also is described.