The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 1991
Filed:
Apr. 03, 1990
Gerhard Doenges, Heidenrod-Kemel, DE;
Heiman GmbH, , DE;
Abstract
A material inspection system, such as a baggage insepction system, uses x-ray imaging to identify organic materials such as drugs and explosives. The articles being inspected are transirradiated with x-rays having different radiation energies. From detected radiation, attenuated by the article under inspection, a materials information signal and a luminance signal are formed. The color of the monitor image is controlled by the materials information signal, and the image brightness, color saturation and white content of the image are controlled by the luminance signal. A color portrayal occurs only when the materials information signal has a sufficiently high signal-to-noise ratio.