The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 1991
Filed:
Apr. 04, 1990
Tsugiko Takase, Tokyo, JP;
Hideo Adachi, Iruma, JP;
Takao Okada, Tokyo, JP;
Hisanari Shimazu, Tokyo, JP;
Hideo Tomabechi, Tokyo, JP;
Olympus Optical Co., Inc., Tokyo, JP;
Abstract
A scanning tunnel microscope includes a piezo-actuator movable in a direction Z perpendicular to the surface of a sample and provided with a scanning probe projected downward from the bottom thereof. The scanning probe is moved in the direction Z by the piezo-actuator. The piezo-actuator includes a position measuring probe projected therefrom, parallel to the surface of the sample, from the lower end of one side thereof. A reference sample having concaves formed on a surface thereof at predetermined intervals is fixed to the piezo-actuator. When the scanning probe is moved in the direction Z, the position measuring probe is moved along the reference sample, so that tunnel current having a waveform which reproduces the shape of the concaved surface of the reference sample is detected. Thus, the moving distance of the scanning probe can be obtained from the waveform of tunnel current detected.