The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 1991
Filed:
Aug. 23, 1989
Hiroshi Kobayashi, Kodaira-shi, Tokyo, JP;
Haruhiko Machida, Shinjuku, Tokyo, JP;
Jun Akedo, Tokyo, JP;
Hiroyoshi Funato, Chigasaki, JP;
Ricoh Company, Ltd., Tokyo, JP;
Other;
Abstract
A rotation quantity measuring method and system measures a rotation quantity of an object body. The rotation quantity is measured by irradiating a light from a light source on a grating pattern which is formed on a peripheral surface of a cylindrical body which rotates integrally with the object body, and detecting a shadow picture pattern which is generated by a reflected light received from the grating pattern based on a diffraction caused by the grating pattern. Then, the rotation quantity of the object body is measured based on a movement of the shadow picture pattern as the object body rotates.