The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 1991
Filed:
Aug. 10, 1989
Santos F Gutierrez, Ruschlikon, CH;
Alexis Baratoff, Schonenberg, CH;
Wolfgang D Pohl, Adliswil, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
In a scanning tunneling microscope, the tunnel tip comprises an optically transparent body coated with a semiconductor layer, such as a GaAs layer. A sample being investigated comprises a magnetic material. Tunnel microscope operation permits investigation of the magnetic properties at or near the surface of the sample where a spin-polarized beam of light impinges upon the sample surface, through the transparent body of the tunnel tip, or after traveling through the sample, or when made to impinge upon the surface at an angle of incidence from an axis normal to the sample surface. In addition to conventional scanning tunneling microscope electronics, an oscillator-controlled phase-sensitive detector or gating means and a display unit are provided for direct viewing of the magnetic properties and the topography of the sample.