The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 1991
Filed:
Nov. 28, 1989
Mark A Swart, Upland, CA (US);
Charles J Johnston, Walnut, CA (US);
Everett/Charles Contact Products, Inc., Pomona, CA (US);
Abstract
A breakaway switch probe comprises an outer barrel, a movable plunger in one end portion of the barrel, a terminal projecting from the other end of the barrel, and a breakaway clip mounted on the barrel and normally engaging a contact surface on the plunger for retaining the plunger in its at-rest position, substantially immovable in the barrel and out of contact with a switch point on the terminal. The plunger is normally retained in its at-rest position spaced from the switch point so that absence of contact between the plunger and the switch point produces an electrical open-circuit condition in electrical test circuitry connected to the probe. An external test force of less than the preset level applied to the plunger in opposition to the resistance force of the breakaway clip will not move the plunger from its at-rest position, thereby retaining the open-circuit test indication. The breakaway clip is movable away from its engagement with the contact surface of the plunger when the external test force applied to it exceeds the threshold level, and the movement of the breakaway clip away from the plunger contact surface releases the plunger for travel in the barrel toward and into contact with the switch point to produce a closed-circuit condition in the electrical test circuit connected to the switch probe.