The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 1991
Filed:
Jun. 29, 1989
Applicant:
Inventor:
Koji Iwasaki, Tokyo, JP;
Assignee:
Seiko Instruments Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250309 ; 250305 ; 250306 ; 250310 ; 324 713 ; 3241 / ;
Abstract
A focused ion beam apparatus which has a secondary electron energy filter apparatus. The secondary electron energy filter apparatus is basically composed of an extraction electrode for extracting secondary electrons generated from a sample by irradiating an ion beam thereon, and a grid electrode for discriminting the secondary electrons based on their energy levels. The focused ion beam apparatus is also equipped with a secondary electron detector for detecting secondary electrons which pass the grid electrode, thereby measuring the potential of the surface of the sample under treatment.