The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 1991
Filed:
Mar. 01, 1990
Arnaud Du Chene, Paris, FR;
Bernard Dias, Paris, FR;
Thomson-CSF, Paris, FR;
Abstract
A device for the testing of electrical circuits and a circuit comprising the said device are disclosed. The testing device is used to test electrical circuits by the generation of test vectors and the compression of the signal at the output of the device to be tested. The device of the present invention uses the same shift register, certain cells of which are looped at the input, by means of an exclusive-OR logic gate, to generate test vectors and perform signature analysis. Thus it is possible to test electrical circuits themselves as well as the input/output buses. The invention can be applied, in particular, to the testing of computers, microprocessors, memories, fast Fourier transform calculators, adders, multipliers, combinational logic systems or circuits including combinational logic systems or circuits that have internal memorizing devices.