The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 1991
Filed:
Jun. 10, 1987
Applicant:
Inventors:
Nicholas A Perna, Eltoro, CA (US);
Norman C Walker, Solana Beach, CA (US);
Assignee:
Odetics, Inc., Anaheim, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F / ;
U.S. Cl.
CPC ...
364569 ; 368121 ;
Abstract
An integrated system for precise measurement of time intervals wherein a high resolution and accuracy can be achieved through the implementation of an interpolation function and a self calibration function. The interpolation function scales down a relatively coarse major time base to a finer time base for the portions near the boundaries of the time interval that is being measured. The calibration function is built into the system for facilitating calibration of the interpolation function under actual operating of the system.