The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 1991
Filed:
Mar. 20, 1989
Ippei Takahashi, Shizouka, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
An apparatus for inspecting the surface of a web material moving lengthwise at a constant speed by scanning the surface in the direction of the width of the surface with a light beam. The scanned beam modulated by the surface is received and converted into an electric signal which is divided into division signals representing lengthwise areas of the surface. At least one of the lengthwise areas or lanes into which the surface is divided is specified to be subjected to surface inspection. Surface signals of the specified lengthwise areas or lanes are separated from the other surface signals and evaluated for qualifying the surface of the web material.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile