The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 1990

Filed:

Jul. 13, 1988
Applicant:
Inventors:

Richard A Sones, Cleveland Heights, OH (US);

Karen L Lauro, South Euclid, OH (US);

Rodney A Mattson, Mentor, OH (US);

Assignee:

Picker International, Inc., Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
378207 ; 2502521 ;
Abstract

An apparatus and method is disclosed for facilitating calibration of a dual energy digital radiography system having a focused multi-element detector assembly. The apparatus includes two sets of calibration elements, each set made of a different basis material. Each calibration element defines a segment of an annulus and is positionable between the system source and detector such that the center defined by the annulus is substantially coincident with the focal spot of the source. Within individual sets, the thicknesses of the respective member elements differ one from another in accordance with a binary progression. Each of the calibration elements is positioned and sized such that it intercepts and attenuates all radiation which ultimately falls upon the detector.


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