The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 1990
Filed:
Feb. 23, 1990
Soichiro Yasunaga, Kawasaki, JP;
Kensuke Hasegawa, Kawasaki, JP;
Riken Denshi Co., Ltd, Higashiarima, JP;
Abstract
The location of an aperture surrounded by a region of different brightness on a plane surface is achieved by line scanning the surface with an optical scanner while shifting the line position stepwise in an orthogonal direction. A change in brightness as the scanner passes between the region and aperture creates in the scanning signals, a pulse indication of the aperture position. Signals for a progressively changing group of successive scanning lines large enough in number to span a given aperture on either side in the orthogonal direction and include a signal for at least one line intersecting the aperture; i.e., three or more consecutive lines, are synchronously compared by time delaying the earlier signals to coincide with the real time signal. The coincidence of one or more line signals indicative of an aperture directly preceded and followed by a line signal free of an aperture indication signifies the presence of an aperture. The aperture indication can be timed to give the X-axis and X-axis coordinates therefor. The aperture indication signal is checked for abnormalities before being accepted.