The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 1990
Filed:
Nov. 13, 1989
Applicant:
Inventors:
Mark Cronin-Golomb, Reading, MA (US);
Joseph Shamir, Haifa, IL;
Assignee:
Tufts University, Medford, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356361 ;
Abstract
An interferometric device for measuring optical thin film parameters such as refractive index, thickness and absorption uses phase conjugate mirrors in place of standard mirrors. The optical thin film for which the refractive index, thickness and absorption are determined acts as a beam-splitter in the interferometer.