The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 1990
Filed:
Sep. 25, 1987
Junpei Tsujiuchi, Kawasaki, JP;
Shigeto Ikeda, Tokyo, JP;
Toshio Honda, Yokohama, JP;
Nagaaki Ohyama, Kawasaki, JP;
Susumu Kikuchi, Hachioji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
The method for detecting corresponding regions between a plurality of picture images comprises the steps of setting respective operation object regions for a plurality of picture images, calculating a variance of mutual concentration or density distributions in the operation object regions, and detecting the operation object regions which have been set in which the calculated variance value is at a minimum. The apparatus for detecting corresponding regions between picture images comprises a variance calculating member for calculating a variance of mutual concentration or density distributions in the operation object regions of a plurality of picture images, and a corresponding region detecting member for detecting a seat of regions where a variance value calculated by the variance calculating device is at a minimum.