The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 1990

Filed:

Apr. 13, 1990
Applicant:
Inventors:

Hegeon Kwun, San Antonio, TX (US);

Gary L Burkhardt, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G06F / ;
U.S. Cl.
CPC ...
364507 ; 364508 ; 364552 ; 73600 ; 73602 ;
Abstract

A non-destructive method for evaluating ropes, cables, and strands for flaws and tension is shown. The method permits detecting flaws by recognizing certain vibrational wave amplitude and distribution patterns resulting from striking a test subject with a transverse force. Tension on a test subject is calculated by measuring propagation velocity of the vibrational waves through the test subject. An apparatus is provided which produces vibrational waves in a test subject, measures the amplitude and time distribution of the waves, and displays the measurements for analysis.


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