The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 11, 1990

Filed:

Jul. 25, 1988
Applicant:
Inventor:

William H Smith, St. Louis, MO (US);

Assignee:

Washington University, St. Louis, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01J / ;
U.S. Cl.
CPC ...
356346 ;
Abstract

An interferometer with a cylindrical lens which produces an interferogram imaging the field of view in the redundant coordinate onto a photon noise limited detector comprising a charge-coupled device or CCD having pixels aligned along two dimensions to provide spatial resolution in that dimension of the light source as well as spectral resolution. The CCD is also characterized by greater dynamic range, lower pixel response variation, and is photon noise limited, all of which enhances its use as a detector for a spectrometer.


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