The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 1990
Filed:
Mar. 31, 1989
Roland M Bazin, Vitry S/Seine, FR;
Gerard Obadia, Montrouge, FR;
Louis Marcotte, Chevilly La Rue - Rungis, FR;
Jean Scot, Paris, FR;
L'Oreal, Paris, FR;
Abstract
The method for measuring the elasticity of a superficial layer (2), in particular of the skin, comprises defining a zone (7) of this layer; creating a negative pressure in this zone to cause a deformation of the zone; and measuring the negative pressure necessary to cause a deformation of predetermined amplitude. The measuring device includes a sensor (3) provided with a cavity (5) defined by a rim (6) arranged to be pressed against the layer (2) to be studied, and a pump (17) for creating a negative pressure in the cavity (5). A suction opening (20) is provided in the cavity at a predetermined distance (d) from the superficial layer, in such a manner as to be obturated by the layer when the deformation attains the predetermined amplitude. A pick-up device is provided for measuring the negative pressure that has produced the deformation of predetermined amplitude.