The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 1990
Filed:
Mar. 17, 1989
Kenzo Yonezawa, Tama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
An optimized process control method comprises the steps of: delivering an operation variable to a control system model device which includes one or more model equations which are so modeled that the output obtained when the same process value is delivered to a control object process, is within a predetermined tolerable range and which receives the valve representative of the condition of a real process; receiving an evaluation function which is the result of the arithmetic operation of the one or more model equations, thereby causing the control system model device to carry out an operation for searching for a first optimum control point; defining said first optimum point as an initial value and outputting a set value for the real process from the region whose center is the initial value and which is within an allowable degree of error with respect to a true optimum point; and in response to the set value, searching for a second optimum point for the real process on the basis of the value representative of the condition of the real process according to a trial-and-error searching optimization algorithm, such as simplex method. An optimized process control apparatus which realize the method is also disclosed.