The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 1990
Filed:
Apr. 17, 1989
Applicant:
Inventors:
Hiroshi Tomimasu, Syracuse, NY (US);
Philip Luner, Syracuse, NY (US);
Assignee:
The Research Foundation of State University of NY, Albany, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250306 ; 250307 ; 250311 ; 250397 ;
Abstract
Distribution of mass density of paper or other materials is determined by irradiating a sample with a burst of electron beams from an electron gun. The intensity levels of electron beams emerging from said sample are detected by an areal detector located immediately behind the sample. These intensity levels are processed to derive distribution of mass density information for the sample. The electron beam detector may be a photographic film or a realtime electron beam detector assembly coupled to computer controlled digital data processing and displaying equipment.