The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 1990

Filed:

Dec. 29, 1989
Applicant:
Inventors:

Jochen Franzen, Bremen, DE;

Reemt-Holger Gabling, Bremen, DE;

Gerhard Heinen, Grasberg, DE;

Gerhard Weiss, Weyhe, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
250291 ; 250281 ; 250282 ; 250290 ;
Abstract

A method for the measurement of mass spectra by three dimensional quadrup fields (QUISTORs) is presented, in which the ions are mass-to-charge selectively ejected by a selected nonlinear resonance effect in an inharmonic QUISTOR. In order to enhance scan speed and mass resolution, the ejection of a single kind of ions can be confined to a very small time interval, either by the generation of ions within a small volume outside the field center, or by an excitation of the secular amplitudes by an additional RF voltage across the end electrodes, shortly before the ions encounter the sum resonance condition. An instrument for this method is described.


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