The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 1990

Filed:

Nov. 01, 1988
Applicant:
Inventors:

Albert C Breidegam, Sharpsburg, GA (US);

C James Corris, Shenandoah, GA (US);

Frank J McCarty, Lake Worth, FL (US);

Assignee:

Semtronics Corporation, Peachtree City, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05F / ;
U.S. Cl.
CPC ...
361231 ; 361213 ; 361235 ;
Abstract

An area ionization system which includes a first set of positive emitters and a second set of negative emitters for providing a supply of positive and negative ions to a work area. A control circuit or computerized control system simultaneously provides high voltage to the positive emitters and to the negative emitters. This 'steady state DC' system has been found to be superior to previous systems which provide alternating current or pulsed direct current to emitters. The steady, balanced supply of positive and negative ions allows faster charge decay rates within the work area as well as reduced foreign material contamination. The system also distributes power to the emitters throughout the work area via low voltage lines. The low voltage is stepped up in the emitter arrays in order to supply 8-12 kilovolts to the emitters. The lower voltage requirements as compared to alternating current and pulse direct current systems reduces production of harmful ozone, and the low voltage distribution system decreases conflicts with electrical code requirements. This system also allows the environmental history for products manufactured in the work area to be documented, including the following parameters: ionization, temperature, humidity, air flow, and ozone data.


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