The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 1990
Filed:
Apr. 27, 1989
Ian C McMichael, Port Hueneme, CA (US);
Mohsen Khoshnevisan, Newbury Park, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A three-dimensional object is imaged by providing a coherent beam of light with a periodic variation in frequency and dividing the beam into a probe beam and a pump beam. The probe beam is directed toward the object, such that the frequency profile of the probe beam after reflection from the object is determined by the depth profile of the object. The pump beam and the reflected probe beam are directed into a nonlinear medium, such that two-wave mixing between the beams occurs in the medium, the two-wave mixing process causing the frequency profile of the probe beam to be converted to an intensity profile. The method may be further refined by adjusting the optical path length of the pump beam in order to adjust the accuracy range of the depth profile which is imaged. In addition, the reflected intensity profile of the object can be obtained from the reflected probe beam prior to the mixing of the probe beam and the pump beam and subtracted from the converted intensity profile to correct the converted intensity profile for variations in the surface reflectivity of the object. A nonlinear optical ranging imager for imaging a three-dimensional object includes a source of coherent light with a periodic variation in frequency and a beam splitter for dividing the source into a pump beam and a probe beam directed at the object, such that a frequency profile of the probe beam after reflection from the object is determined by the depth profile of the object. A nonlinear optical medium receives the reflected probe beam and the pump beam, such that two-wave mixing between the two beams occurs within the medium, the two-wave mixing process causing the frequency profile of the probe beam to be converted to an intensity profile.