The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 1990
Filed:
Mar. 16, 1990
E Mark Haacke, University Heights, OH (US);
Zhi-pei Liang, Cleveland, OH (US);
Case Western Reserve University, Cleveland, OH (US);
Abstract
An imaging apparatus and method which provides for reconstruction of images from sampled data with improved resolution, improved signal-to-noise, optimal edge detection, and pattern recognition. The apparatus and method are characterized by the use of a priori information (constraints) and a high pass filter on the data to obtain superresolution reconstruction of image data. An object function is approximated by a series of known model functions such as box car and polynomial functions. Solution of the object function depends on a finite number of unknowns whereupon the model parameters can be perfectly resolved to obtain infinite or superresolution. The apparatus and method have particular application in nuclear magnetic resonance imaging as well as other imaging modalities.