The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 1990
Filed:
Apr. 10, 1989
Werner Gurny, Wadgassen, DE;
Eberhard Hausler, Saarbrucken, DE;
Wegu-Messtechnik GmbH, Wadgassen, DE;
Abstract
A piezo-controlled dynamic probe or feeler head for measuring installations and measuring machine, which is in an operative connection with a measurement evaluating or plotting unit and, selectively with a measuring machine control. The probe is constructed from two mutually independently operating measuring signal generating installations, which are equipped with mutually separate or independent circuits and which act in such a manner on the measuring evaluating or plotting unit and, selectively, on the measuring machine control, that upon the generation of a signal from the first measuring signal generating installation, stored data regarding the position of the probe can be recognized as being valid only at the presence of a confirmation or acknowledging signal from the second measuring signal generating installation.