The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 1990
Filed:
Mar. 28, 1989
Yoshiaki Kurosawa, Yokohama, JP;
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A pattern recognition apparatus has a contour segmentation unit for dividing an input pattern into segments, a characteristic extraction unit for extracting characteristics of the input segments, and a reference unit for storing characteristic data of reference patterns. The reference unit includes a main reference and a detailed matching reference. The main reference stores partial pattern characteristic data representing the characteristics of segments of each reference pattern. The detailed matching reference stores detailed characteristic data of each reference pattern together with a program for specifying an operation procedures thereof. A matching processor sequentially compares and collates the input pattern with the reference patterns to find out that standard pattern with which the input pattern is matched with the highest similarity. When the input pattern is matched with several reference patterns, a detailed recognition unit performs a detailed recognition process using the detailed characteristic data of these reference patterns to finally select the correct one from among the reference patterns. The main reference additionally stores identification marks to identify specific reference segments necessary to acquired the above detailed characteristic data.