The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 1990

Filed:

Jan. 04, 1988
Applicant:
Inventor:

Ephrem A Chemaly, Austin, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-8 ; 382 41 ;
Abstract

An automatic system for the inspection of surfaces of an object employing computer vision. The system examines the uniformity of the surface and adds it to the negative of an ideal mask, and then thresholds the result to determine if the object is defective or not. A binary image showing only the defects is generated by the system. The system ignores surface features, such as locating notches or markings that are intentional, by 'fitting' them with their morphological negatives. Small electronic packages, such as integrated circuit plastic packages (e.g. dual-in-line packages or DIPs), can be accurately inspected by the system. The system provides an objective, fast and economical method of inspecting objects.


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