The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 20, 1990

Filed:

Jan. 23, 1990
Applicant:
Inventors:

Marius Brok, Eindhoven, NL;

Cornelis Slump, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ; H05G / ; H05G / ;
U.S. Cl.
CPC ...
378207 ; 378210 ; 378 99 ;
Abstract

The modulation transfer function of a digital imaging system is measured using a test object comprising a number of slits. The effect of geometrical distortions on the MTF measurement, is minimized by making the dimension of the test object as small as possible with respect to the image detector. The minimum slit spacing d enabling suitable MTF measurement is expressed in the number of pixels N over a dimension L of the image detector: d>8L/N.


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