The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 1990

Filed:

Aug. 21, 1989
Applicant:
Inventors:

Yasuo Naruke, Kawasaki, JP;

Thoru Mochizuki, Yokohama, JP;

Taira Iwase, Kawasaki, JP;

Masamichi Asano, Tokyo, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365 96 ; 3652257 ; 357 51 ;
Abstract

A spare memory cell comprises a read FET (Field Effect Transistor), a fusing FET and a current fuse. The FETs are connected in series between a read data line and a low voltage source. The fuse is inserted between a series node of the FETs and a write data line. The fuse is molten when data is written to the spare memory cell. By applying a power source voltage to a control electrode of the fusing FET and by applying a voltage that is higher than the power source voltage to the write data line, the fusing FET is set to its secondary breakdown state. Under this state, a large current flows through the fusing FET to cut off the fuse, thus writing data to the spare memory cell.


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