The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 1990

Filed:

Aug. 24, 1989
Applicant:
Inventors:

Masato Ishizawa, Katsuta, JP;

Hiroshi Hashimoto, Naka, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01N / ; B01L / ;
U.S. Cl.
CPC ...
324662 ; 324686 ; 7386424 ; 422 67 ; 422100 ; 422106 ;
Abstract

Analytical equipment, in which liquid substances in sample containers and reagent containers are delivered to reaction cells by a vertically movable probe. The sample containers and the reagent containers are supported on a rotatable metal plate. The metal plate is rotated to place one of the sample containers or reagent containers at a sample or reagent pipetting position. The probe transmits a high-frequency signal to detect a change in electrostatic capacitance between itself and the metal plate at a time the probe is put in contact with a liquid substance in the sample or reagent container. A spline shaft for moving the probe in a vertical direction has a detection plate, and a control signal is generated when the detection plate reaches a predetermined position. The generation of the high-frequency signal is stopped when the probe begins to make a descending motion until the control signal is generated, to reduce the adverse effect of disturbing waves on various parts.


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