The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 1990

Filed:

Aug. 31, 1989
Applicant:
Inventors:

Thomas H Nash, Jr, Easton, CT (US);

Celia P Chang, New Canaan, CT (US);

Anthony F Poile, Ridgefield, CT (US);

Assignee:

The Perkin-Elmer Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ;
U.S. Cl.
CPC ...
2101982 ; 73 6 / ; 210 961 ; 210143 ; 364499 ; 364502 ; 422 70 ;
Abstract

A liquid chromatographic instrument includes specimen vessels in randomly designated locations. An automatic sampler sequentially samples specimens from selected vessels based on instructions from a set of command instruction lines. A detector module measures characteristics of each sampled specimen, and results for each test specimen relative to a standard specimen are computed. A command sequence program includes reading of a user inputed ordered list to effect a sequential selection of each location designation according to the ordered list, generation of a command instruction line corresponding to each sequential selection and containing a location designation and measurement instructions for each selected specimen, counting of the number of command instruction lines generated since a nearest prior calibration command instruction line, and in response to the counting number being equal to the calibration frequency, generation of a next calibration command instruction line containing the location designation and the measurement instructions for the standard specimen.


Find Patent Forward Citations

Loading…