The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 1990
Filed:
Feb. 27, 1990
William D Humbel, Rochester, NY (US);
Donald E Vandenberg, Brockport, NY (US);
John G Pitek, Rochester, NY (US);
Thomas W Dey, Springwater, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
The historical Foucault knife-edge test enables one to qualitatively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The novel method of the present invention, in sharp contrast, complements the historical Foucault knife-edge test, by expanding the test so as to develop a quantitative interpretation of the imaging device's characteristics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile