The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 1990
Filed:
Sep. 06, 1989
Carl C Scheid, Delafield, WI (US);
James A McFaul, Waukesha, WI (US);
David L McDaniel, Dousman, WI (US);
Norbert J Pelc, Wauwatosa, WI (US);
David M Barrett, Brookfield, WI (US);
General Electric Company, Milwaukee, WI (US);
Abstract
Method and apparatus for minimizing scatter in an X-ray imaging system of the type including a controllable source of X-ray radiation and means for collimating the X-ray radiation into a fan-shaped beam and effecting scanning of the X-ray beam across a target area. The improved system includes a grid assembly extending in a transverse direction across the target area and having a relatively narrow width in the beam scanning direction. A drive is coupled to the grid removing the grid in synchronism with the X-ray beam and an X-ray impervious belt is coupled to the grid and extends in a transverse direction across the target area and is movable with the grid for covering the target area outside the grid to prevent scatter radiation from impinging on X-ray film located beneath the grid. In one form, the grid includes a plurality of air interspersed septa to allow reduced beam energy. In another form, the X-ray beam is collimated into a point source by the use of an X-ray impervious disk positioned adjacent to and overlaying an X-ray window in the X-ray source.