The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 06, 1990
Filed:
Mar. 02, 1988
Yasushi Azumatani, Neyagawa, JP;
Isao Satoh, Neyagawa, JP;
Makoto Ichinose, Sakai, JP;
Yoshihisa Fukushima, Osaka, JP;
Yuzuru Kuroki, Toyonaka, JP;
Yuji Takagi, Kadoma, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
The apparatus includes a one-chip microcontroller, an error flag counter and an error comparison circuit to detect whether or not an optical disk or an internal optical head of the apparatus is fouled. Test data is recorded on a self-diagnostic area of the optical disk when the optical disk loaded in the apparatus is new and has not yet been used, and initial error information detected in the test data reproduced from the self-diagnostic area is registered on an error managing area of the optical disk. When an optical disk which has already been used is loaded, error information detected in the test data recorded on and reproduced from the self-diagnostic area of the optical disk is compared with the initial error information registered in the error managing area of the optical disk. When the comparison shows that the number of data errors is greater than a predetermined reference value, the optical disk or the internal optical head is fouled to such an extent that the recording and reproducing function cannot be satisfactorily performed.