The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1990

Filed:

Jan. 19, 1989
Applicant:
Inventor:

Tadahiko Maeda, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
343703 ; 343765 ; 342360 ;
Abstract

A radiation field characteristic measuring apparatus comprises a rotating device for rotating a tested object through the total solid angle thereof, and a device for receiving electromagnetic waves radiated from the object, thereby measuring electromagnetic field characteristics of the object with respect to the total solid angle. According to the present invention, almost all the components of the rotating device are formed of a nonmetallic material, and spaces to allow the passage of the electromagnetic waves are formed in the components of the rotating device. Thus, reflection and scattering of the electromagnetic waves are suppressed, so that the radiation field characteristics of the tested object, with respect to the total solid angle thereof, can be obtained with high accuracy. Also, the effective radiated power is measured with use of the arrival probability density function of radio waves as a weighting function. By doing this, the evaluation index of an antenna best suited for the actual radio conditions can be obtained.


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